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Applications and development of acoustic and microwave atomic force microscopy for high resolution tomography analysis

2016

The atomic force microscope (AFM) is a powerful tool for the characterization of organic and inorganic materials of interest in physics, biology and metallurgy. However, conventional scanning probe microscopy techniques are limited to the probing surface properties, while the subsurface analysis remains difficult beyond nanoindentation methods. Thus, the present thesis is focused on two novel complementary scanning probe techniques for high-resolution volumetric investigation that were develop to tackle this persisting challenge in nanometrology.The first technique considered, called Mode Synthesizing Atomic Force Microscopy (MSAFM), has been exploited in collaboration with Dr. Laurene Teta…